XTOP 2018

XTOP 2018 (the 14th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging) will take place in Bari, Italy, from 2nd to 7th September 2018. The first day is devoted to the companion school with tutorial lectures, aimed (not only) to students.


The first XTOP conference X-Ray Topography and High Resolution Diffraction took place in Marseille in 1992. The original topics covered were X-ray topography, double- and triple-crystal diffractometry, reflectometry and standing waves technique. Later, other topics such as small-angle scattering and a broad portfolio of imaging were added.

XTOP brings together scientists from the fields of:

  • coherent and conventional X-ray diffraction imaging and topography
  • X-ray diffractometry
  • X-ray absorption and phase contrast imaging
  • methods and instrumentation in laboratory
  • synchrotron-based high-resolution X-ray diffraction methods
  • reflectometry and standing waves technique
  • micro-tomography
  • phase contrast imaging
  • small-angle scattering


February, 23th: early registration and abstract submission
May, 1st: deadline for abstracts to be considered for oral presentations
After July, 1st: late registration

Registration: http://backoffice.instm.it/xtop2018/
Web site: www.ba.ic.cnr.it/xtop2018
Download: Flyer

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